I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Experimental and simulation analysis of carrier lifetimes i..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Driussi, F. ; Pilotto, A. ; De Belli, D.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/ICMTS48187.2020.9107920