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1 Ergebnisse
1
Performance and Reliability of 4 Mb eFLASH Memory Array Fea..:
, In:
2020 IEEE International Memory Workshop (IMW)
,
Jourba, S.
;
Bollon, N.
;
Decobert, C.
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IMW48823.2020.9108118
RT T1
2020 IEEE International Memory Workshop (IMW)
: T1
Performance and Reliability of 4 Mb eFLASH Memory Array Featuring 28 nm Split-Gate Cell with HKMG Select Transistor
UL https://suche.suub.uni-bremen.de/peid=ieee-9108118&Exemplar=1&LAN=DE A1 Jourba, S. A1 Bollon, N. A1 Decobert, C. A1 Festes, G. A1 Bertello, B. A1 Zhou, F. A1 Markov, V. A1 Tkachev, Y. A1 Kim, J. A1 Ghazav, P. A1 Liu, X. A1 Do, N. A1 Richter, R. A1 Dunkel, S. A1 Trentzsch, M. A1 Zaka, A. A1 Herrmann, T. A1 Melde, T. A1 Muller, B. A1 Mauersberger, F. A1 Bayha, B. A1 Wittek, S. A1 Duggan, M. A1 Beyer, S. YR 2020 SN 2573-7503 K1 ESF3 K1 split-gate flash cell K1 floating gate K1 HKMG SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IMW48823.2020.9108118 DO https://doi.org/10.1109/IMW48823.2020.9108118 SF ELIB - SuUB Bremen
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