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1 Ergebnisse
1
Study of Temperature Sensitivity on Linearity Figures of Me..:
, In:
2020 URSI Regional Conference on Radio Science ( URSI-RCRS)
,
Tripathy, Manas Ranjan
;
Kumar Singh, Ashish
;
Baral, Kamalaksha
... - p. 1-4 , 2020
Link:
https://doi.org/10.23919/URSIRCRS49211.2020.9113520
RT T1
2020 URSI Regional Conference on Radio Science ( URSI-RCRS)
: T1
Study of Temperature Sensitivity on Linearity Figures of Merit of Ge/Si Hetero-Junction Gate-Drain Underlapped Vertical Tunnel FET with heterogeneous gate dielectric structure for Improving Device Reliability
UL https://suche.suub.uni-bremen.de/peid=ieee-9113520&Exemplar=1&LAN=DE A1 Tripathy, Manas Ranjan A1 Kumar Singh, Ashish A1 Baral, Kamalaksha A1 Singh, Prince Kumar A1 Kumar Mishra, Ashwini A1 Jarwal, Deepak Kumar A1 Jit, Satyabrata YR 2020 K1 TFET K1 heterojunction K1 heterogenous gate dielectric K1 sub-threshold swing (SS) K1 source pocket K1 drain underlap K1 linearity K1 FOMs SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/URSIRCRS49211.2020.9113520 DO https://doi.org/10.23919/URSIRCRS49211.2020.9113520 SF ELIB - SuUB Bremen
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