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1 Ergebnisse
1
Fully Automated Analog Sub-Circuit Clustering with Graph Co..:
, In:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Settaluri, Keertana
;
Fallon, Elias
- p. 1714-1715 , 2020
Link:
https://doi.org/10.23919/DATE48585.2020.9116513
RT T1 <cTitle>2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Fully Automated Analog Sub-Circuit Clustering with Graph Convolutional Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9116513&Exemplar=1&LAN=DE A1 Settaluri, Keertana A1 Fallon, Elias YR 2020 SN 1558-1101 K1 Clustering algorithms K1 Automation K1 Analog circuits K1 Feature extraction K1 Convolutional neural networks K1 Measurement K1 Layout K1 analog design automation K1 analog clustering K1 graphical convolutional neural networks SP 1714 OP 1715 LK http://dx.doi.org/https://doi.org/10.23919/DATE48585.2020.9116513 DO https://doi.org/10.23919/DATE48585.2020.9116513 SF ELIB - SuUB Bremen
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