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1 Ergebnisse
1
Wafer-Level Test Path Pattern Recognition and Test Characte..:
, In:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Cheng, Ken Chau-Cheung
;
Shu-Min Li, Katherine
;
Huang, Andrew Yi-Ann
... - p. 1710-1711 , 2020
Link:
https://doi.org/10.23919/DATE48585.2020.9116546
RT T1 <cTitle>2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9116546&Exemplar=1&LAN=DE A1 Cheng, Ken Chau-Cheung A1 Shu-Min Li, Katherine A1 Huang, Andrew Yi-Ann A1 Li, Ji-Wei A1 Chen, Leon Li-Yang A1 Cheng-Yen Tsai, Nova A1 Wang, Sying-Jyan A1 Lee, Chen-Shiun A1 Chou, Leon A1 Liao, Peter Yi-Yu A1 Liang, Hsing-Chung A1 Chen, Jwu-E YR 2020 SN 1558-1101 K1 Character recognition K1 Patents K1 Manufacturing K1 Chemicals K1 Automation K1 Europe K1 wafer test K1 wafer defect map K1 test-induced defects K1 test path recognition K1 test yield SP 1710 OP 1711 LK http://dx.doi.org/https://doi.org/10.23919/DATE48585.2020.9116546 DO https://doi.org/10.23919/DATE48585.2020.9116546 SF ELIB - SuUB Bremen
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