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1 Ergebnisse
1
RESCUE: Interdependent Challenges of Reliability, Security ..:
, In:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Jenihhin, M.
;
Hamdioui, S.
;
Reorda, M. Sonza
... - p. 388-393 , 2020
Link:
https://doi.org/10.23919/DATE48585.2020.9116558
RT T1 <cTitle>2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9116558&Exemplar=1&LAN=DE A1 Jenihhin, M. A1 Hamdioui, S. A1 Reorda, M. Sonza A1 Krstic, M. A1 Langendorfer, P. A1 Sauer, C. A1 Klotz, A. A1 Huebner, M. A1 Nolte, J. A1 Vierhaus, H. T. A1 Selimis, G. A1 Alexandrescu, D. A1 Taouil, M. A1 Schrijen, G. J. A1 Raik, J. A1 Sterpone, L. A1 Squillero, G. A1 Dyka, Z. YR 2020 SN 1558-1101 K1 Europe K1 Security K1 Reliability engineering K1 Fault tolerance K1 Fault tolerant systems K1 Automation K1 reliability K1 security K1 test K1 fault tolerance K1 EDA tools SP 388 OP 393 LK http://dx.doi.org/https://doi.org/10.23919/DATE48585.2020.9116558 DO https://doi.org/10.23919/DATE48585.2020.9116558 SF ELIB - SuUB Bremen
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