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A Defect Image Enhancement Approach for Detection of Defect..:

, In: 2020 International Conference on Machine Vision and Image Processing (MVIP),
Hadi, Saman ; Hasanzadeh, Reza P.R. ; Kersemans, Mathias - p. 1-6 , 2020
Link: https://doi.org/10.1109/MVIP49855.2020.9116901