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1 Ergebnisse
1
Temperature Effects on Electrical Performances of NFinFET T..:
, In:
2019 8th International Conference on Innovation, Communication and Engineering (ICICE)
,
Yang, Hsin-Chia
;
Tsai, Chia-Juan
;
Tseng, Chun-Kai
... - p. 59-61 , 2019
Link:
https://doi.org/10.1109/ICICE49024.2019.9117463
RT T1
2019 8th International Conference on Innovation, Communication and Engineering (ICICE)
: T1
Temperature Effects on Electrical Performances of NFinFET Transistors with Channel Length 90 Nanometers
UL https://suche.suub.uni-bremen.de/peid=ieee-9117463&Exemplar=1&LAN=DE A1 Yang, Hsin-Chia A1 Tsai, Chia-Juan A1 Tseng, Chun-Kai A1 Yang, Ya Yuan A1 Chen, Rui-Sheng A1 Tseng, Jian-Jia A1 Chi, Sung-Ching A1 Liao, Yu-Jung YR 2019 K1 SOI K1 NFinFET K1 Drain-Gate Leakage Current K1 Mobility K1 Early Voltage K1 Over-Exposure and Over-Etching Technique SP 59 OP 61 LK http://dx.doi.org/https://doi.org/10.1109/ICICE49024.2019.9117463 DO https://doi.org/10.1109/ICICE49024.2019.9117463 SF ELIB - SuUB Bremen
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