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1 Ergebnisse
1
Engineering Atom Scale Defects in Materials for Future Elec..:
, In:
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Pramanik, Dipankar
;
Nardi, Federico
;
Padovani, Andrea
- p. 1-4 , 2020
Link:
https://doi.org/10.1109/EDTM47692.2020.9117812
RT T1 <cTitle>2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Engineering Atom Scale Defects in Materials for Future Electronic Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9117812&Exemplar=1&LAN=DE A1 Pramanik, Dipankar A1 Nardi, Federico A1 Padovani, Andrea YR 2020 SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EDTM47692.2020.9117812 DO https://doi.org/10.1109/EDTM47692.2020.9117812 SF ELIB - SuUB Bremen
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