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1 Ergebnisse
1
New Challenges of Design for Reliability in Advanced Techno..:
, In:
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Liu, Changze
;
Sun, Yongsheng
;
Ren, Pengpeng
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/EDTM47692.2020.9117822
RT T1 <cTitle>2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>New Challenges of Design for Reliability in Advanced Technology Node (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9117822&Exemplar=1&LAN=DE A1 Liu, Changze A1 Sun, Yongsheng A1 Ren, Pengpeng A1 Gao, Dan A1 Luo, Weichun A1 Chen, Zanfeng A1 Xia, Yu YR 2020 K1 reliability K1 Variation K1 self-heating K1 BTI K1 HCI K1 SRAM SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EDTM47692.2020.9117822 DO https://doi.org/10.1109/EDTM47692.2020.9117822 SF ELIB - SuUB Bremen
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