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Low interface trap density in AlGaN/GaN Metal-Insulator-Sem..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Ranjan, K. ; Arulkumaran, S. ; Ng, G. I.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/EDTM47692.2020.9117851