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1 Ergebnisse
1
Reliability Analysis Of Gate-All-Around Floating Gate (GAA-..:
, In:
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Hamid, Farah
;
Alias, N. Ezaila
;
Hamzah, Afiq
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/EDTM47692.2020.9117949
RT T1 <cTitle>2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Reliability Analysis Of Gate-All-Around Floating Gate (GAA-FG) With Variable Oxide Thickness For Flash Memory Cell</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9117949&Exemplar=1&LAN=DE A1 Hamid, Farah A1 Alias, N. Ezaila A1 Hamzah, Afiq A1 Johari, Zaharah A1 Tan, M. L. Peng A1 Ismail, Razali A1 Soin, Norhayati YR 2020 K1 High-k K1 P/E K1 Retention K1 Endurance K1 Flash memory SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EDTM47692.2020.9117949 DO https://doi.org/10.1109/EDTM47692.2020.9117949 SF ELIB - SuUB Bremen
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