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1 Ergebnisse
1
Analysis of GaN Converter Circuit Stability Influenced by C..:
, In:
2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Videt, Arnaud
;
Li, Ke
;
Idir, Nadir
.. - p. 2570-2576 , 2020
Link:
https://doi.org/10.1109/APEC39645.2020.9124351
RT T1
2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
: T1
Analysis of GaN Converter Circuit Stability Influenced by Current Collapse Effect
UL https://suche.suub.uni-bremen.de/peid=ieee-9124351&Exemplar=1&LAN=DE A1 Videt, Arnaud A1 Li, Ke A1 Idir, Nadir A1 Evans, Paul A1 Johnson, Mark YR 2020 SN 2470-6647 K1 GaN HEMT K1 gate instability K1 current collapse K1 trapping K1 double-pulse test K1 commutation SP 2570 OP 2576 LK http://dx.doi.org/https://doi.org/10.1109/APEC39645.2020.9124351 DO https://doi.org/10.1109/APEC39645.2020.9124351 SF ELIB - SuUB Bremen
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