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Stop-and-Go Gate Drive Minimizing Test Cost to Find Optimum..:

, In: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC),
Sai, Toru ; Miyazaki, Koutaro ; Obara, Hidemine... - p. 3096-3101 , 2020
Link: https://doi.org/10.1109/APEC39645.2020.9124356