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Design of a submillimeter ellipsometer for the measurement ..:
, In:
1985 Tenth International Conference on Infrared and Millimeter Waves
,
Giles, R. H
;
Coulombe, M. J.
- p. 319-321 , 1985
Link:
https://doi.org/10.1109/IRMM.1985.9126703
RT T1 <cTitle>1985 Tenth International Conference on Infrared and Millimeter Waves</cTitle>: T1 <Title>Design of a submillimeter ellipsometer for the measurement of complex indices of refraction of materials</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9126703&Exemplar=1&LAN=DE A1 Giles, R. H A1 Coulombe, M. J. YR 1985 K1 Optical device fabrication K1 Optical polarization K1 Optical pumping K1 Optical reflection K1 Optical refraction K1 Optical variables control SP 319 OP 321 LK http://dx.doi.org/https://doi.org/10.1109/IRMM.1985.9126703 DO https://doi.org/10.1109/IRMM.1985.9126703 SF ELIB - SuUB Bremen
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