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Precision millimeter and submillimeter wave measurements of..:
, In:
1987 Twelth International Conference on Infrared and Millimeter Waves
,
Afsar, Mohammed Nurul
- p. 15a-15b , 1987
Link:
https://doi.org/10.1109/IRMM.1987.9126887
RT T1 <cTitle>1987 Twelth International Conference on Infrared and Millimeter Waves</cTitle>: T1 <Title>Precision millimeter and submillimeter wave measurements of material properties</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9126887&Exemplar=1&LAN=DE A1 Afsar, Mohammed Nurul YR 1987 K1 Dielectrics K1 Absorption K1 Millimeter wave technology K1 Permittivity K1 Resonant frequency K1 Refractive index K1 Silicon SP 15a OP 15b LK http://dx.doi.org/https://doi.org/10.1109/IRMM.1987.9126887 DO https://doi.org/10.1109/IRMM.1987.9126887 SF ELIB - SuUB Bremen
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