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Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under O..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Kemmer, Tobias ; Dammann, Michael ; Baeumler, Martina... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128308