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Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020

Link: https://doi.org/10.1109/IRPS45951.2020.9128317

RT 
T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9128317&Exemplar=1&LAN=DE
				
A1 Lee, T. Y.
A1 Yamane, K.
A1 Hau, L. Y.
A1 Chao, R.
A1 Chung, N. L.
A1 Naik, V. B.
A1 Sivabalan, K.
A1 Kwon, J.
A1 Lim, J. H.
A1 Neo, W. P.
A1 Khua, K.
A1 Thiyagarajah, N.
A1 Jang, S. H.
A1 Behin-Aein, B.
A1 Toh, E. H.
A1 Otani, Y.
A1 Zeng, D.
A1 Balasankaran, N.
A1 Goh, L. C.
A1 Ling, T.
A1 Hwang, J.
A1 Zhang, L.
A1 Low, R.
A1 Tan, S. L
A1 Seet, C. S.
A1 Ting, J. W.
A1 Ong, S.
A1 You, Y. S.
A1 Woo, S. T.
A1 Quek, E.
A1 Siah, S. Y.
YR 2020
SN 1938-1891
K1 Data retention
K1 Embedded MRAM (eMRAM)
K1 Magnetic tunnel junction (MTJ)
K1 Magnetic immunity (MI)
K1 Spin transfer torque (STT)
SP 1
OP 4
LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128317
DO https://doi.org/10.1109/IRPS45951.2020.9128317
SF ELIB - SuUB Bremen

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