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1 Ergebnisse
1
A Compact Physics Analytical Model for Hot-Carrier Degradat..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Tyaginov, Stanislav
;
Grill, Alexander
;
Vandemaele, Michiel
... - p. 1-7 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128327
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
A Compact Physics Analytical Model for Hot-Carrier Degradation
UL https://suche.suub.uni-bremen.de/peid=ieee-9128327&Exemplar=1&LAN=DE A1 Tyaginov, Stanislav A1 Grill, Alexander A1 Vandemaele, Michiel A1 Grasser, Tibor A1 Hellings, Geert A1 Makarov, Alexander A1 Jech, Markus A1 Linten, Dimitri A1 Kaczer, Ben YR 2020 SN 1938-1891 K1 Hot-carrier degradation K1 analytical model K1 compact model K1 interface traps K1 carrier transport SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128327 DO https://doi.org/10.1109/IRPS45951.2020.9128327 SF ELIB - SuUB Bremen
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