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Reliability of Metal-Dielectric Structures Under Intermitte..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, C-S. ; Vaitheeswaran, P. ; Subbarayan, G.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128331