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1 Ergebnisse
1
Impact of Ferroelectric Wakeup on Reliability of Laminate b..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Ali, T.
;
Kuhnel, K.
;
Czernohorsky, M.
... - p. 1-9 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128337
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9128337&Exemplar=1&LAN=DE A1 Ali, T. A1 Kuhnel, K. A1 Czernohorsky, M. A1 Rudolph, M. A1 Patzold, B. A1 Olivo, R. A1 Lehninger, D. A1 Mertens, K. A1 Muller, F. A1 Lederer, M. A1 Hoffmann, R. A1 Mart, C. A1 Kalkani, M. N. A1 Steinke, P. A1 Kampfe, T. A1 Muller, J. A1 Houdt, J. Van A1 Seidel, K. A1 Eng, L. M. YR 2020 SN 1938-1891 K1 FeFET K1 Laminate HSO K1 Wakeup K1 MFIS K1 NVMs SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128337 DO https://doi.org/10.1109/IRPS45951.2020.9128337 SF ELIB - SuUB Bremen
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