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1 Ergebnisse
1
Aging Challenges in On-chip Voltage Regulator Design:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Chekuri, Venkata Chaitanya Krishna
;
Singh, Arvind
;
Rahman, Nael Mizanur
.. - p. 1-8 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128339
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Aging Challenges in On-chip Voltage Regulator Design
UL https://suche.suub.uni-bremen.de/peid=ieee-9128339&Exemplar=1&LAN=DE A1 Chekuri, Venkata Chaitanya Krishna A1 Singh, Arvind A1 Rahman, Nael Mizanur A1 Lee, Edward A1 Mukhopadhyay, Saibal YR 2020 SN 1938-1891 K1 NBTI K1 IVR K1 DLDO K1 Aging K1 Auto-tuning K1 Voltage stress SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128339 DO https://doi.org/10.1109/IRPS45951.2020.9128339 SF ELIB - SuUB Bremen
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