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Effect of Drain-to-Source Voltage on Random Telegraph Noise..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Akimoto, R. ; Kuroda, R. ; Teramoto, A.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128341