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1 Ergebnisse
1
Reliability Analysis by Charge Migration of 3D SONOS Flash ..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Jeong, Jun-Kyo
;
Sung, Jae-Young
;
Yang, Hee-Hun
.. - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128344
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Reliability Analysis by Charge Migration of 3D SONOS Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9128344&Exemplar=1&LAN=DE A1 Jeong, Jun-Kyo A1 Sung, Jae-Young A1 Yang, Hee-Hun A1 Lee, Hi-Deok A1 Lee, Ga-Won YR 2020 SN 1938-1891 K1 Flash memories K1 Reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128344 DO https://doi.org/10.1109/IRPS45951.2020.9128344 SF ELIB - SuUB Bremen
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