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1 Ergebnisse
1
Novel Re-configurable Circuits For Aging Characterization: ..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Sutaria, Ketul B.
;
Standfest, Jihan
;
Meric, Inanc
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128347
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9128347&Exemplar=1&LAN=DE A1 Sutaria, Ketul B. A1 Standfest, Jihan A1 Meric, Inanc A1 Davoody, Amirhossein H. A1 Kumar Namalapuri, Swaroop A1 Mutyala, T. A1 P., Supriya A1 Gill, Balkaran A1 Ramey, Stephen A1 Hicks, Jeffery YR 2020 SN 1938-1891 K1 BTI K1 Circuit Aging K1 HCI K1 Re-configurable circuits SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128347 DO https://doi.org/10.1109/IRPS45951.2020.9128347 SF ELIB - SuUB Bremen
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