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Quantum Mechanical Charge Trap Modeling to Explain BTI at C..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Michl, J. ; Grill, A. ; Claes, D.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128349