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Understanding ESD Induced Thermal Mechanism in FinFETs Thro..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Li, Z. ; Zhu, B. ; Nath, A.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128351