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Correlation of Dielectric Breakdown and Nanoscale Adhesion ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, A. ; O'Shea, S. J. ; Bosman, M.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128353