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1 Ergebnisse
1
Reliability Physics of GaN HEMT Microwave Devices: The Age ..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Zanoni, Enrico
;
Meneghini, Matteo
;
Meneghesso, Gaudenzio
... - p. 1-10 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128358
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling
UL https://suche.suub.uni-bremen.de/peid=ieee-9128358&Exemplar=1&LAN=DE A1 Zanoni, Enrico A1 Meneghini, Matteo A1 Meneghesso, Gaudenzio A1 Rampazzo, Fabiana A1 Marcon, Daniele A1 Zhan, Veronica Gao A1 Chiocchetta, Francesca A1 Graff, Andreas A1 Altmann, Frank A1 Simon-Najasek, Michel A1 Poppitz, David YR 2020 SN 1938-1891 K1 GaN K1 HEMT K1 microwave K1 millimeter-wave K1 metal-semiconductor interdiffusion K1 hot-electrons K1 HEMT scaling SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128358 DO https://doi.org/10.1109/IRPS45951.2020.9128358 SF ELIB - SuUB Bremen
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