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Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Nod:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Xu, L. ; Cao, J. ; Brockman, J.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128360