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Effect of Residual TiN on Reliability of Au Wire Bonds duri..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
McGlone, J. M. ; Brizar, G. ; Vanderstraeten, D.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128891