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1 Ergebnisse
1
Impact of Hydrided and Non-Hydrided Materials Near Transist..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Abe, Shin-ichiro
;
Sato, Tatsuhiko
;
Kuroda, Junya
... - p. 1-7 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9128951
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9128951&Exemplar=1&LAN=DE A1 Abe, Shin-ichiro A1 Sato, Tatsuhiko A1 Kuroda, Junya A1 Manabe, Seiya A1 Watanabe, Yukinobu A1 Liao, Wang A1 Ito, Kojiro A1 Hashimoto, Masanori A1 Harada, Masahide A1 Oikawa, Kenichi A1 Miyake, Yasuhiro YR 2020 SN 1938-1891 K1 Single event upset K1 Soft error K1 Neutron K1 J-PARC K1 PHITS SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9128951 DO https://doi.org/10.1109/IRPS45951.2020.9128951 SF ELIB - SuUB Bremen
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