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ON-state retention of Atom Switch eNVM for IoT/AI Inference..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Okamoto, Koichiro ; Nebashi, Ryusuke ; Banno, Naoki... - p. 1-4 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128967