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Statistical Analysis of Bit-Errors Distribution for Reliabi..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Wang, Nian-Jia ; Lee, Kuan-Yi ; Lin, Hsin-Yi... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9128993