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1 Ergebnisse
1
Advanced methods for CPU product reliability modeling and e..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Zonensain, Oren
;
Rechter, Roman
;
Kwasnick, Robert
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129068
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Advanced methods for CPU product reliability modeling and enhancement</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129068&Exemplar=1&LAN=DE A1 Zonensain, Oren A1 Rechter, Roman A1 Kwasnick, Robert A1 Park, Keun Woo A1 Rahman, Anisur A1 Reshef, Almog A1 Raz, Tal A1 Levit, Maxim YR 2020 SN 1938-1891 K1 CPU Performance K1 Product Reliability K1 Voltage Droop K1 Guard Band Optimization SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129068 DO https://doi.org/10.1109/IRPS45951.2020.9129068 SF ELIB - SuUB Bremen
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