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1 Ergebnisse
1
Double Layers Omega FETs with Ferroelectric HfZrO2 for One-..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Chen, K.-T.
;
Lo, C.
;
Lin, Y.-Y.
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129088
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Double Layers Omega FETs with Ferroelectric HfZrO2 for One-Transistor Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129088&Exemplar=1&LAN=DE A1 Chen, K.-T. A1 Lo, C. A1 Lin, Y.-Y. A1 Chueh, C.-Y. A1 Chang, C. A1 Siang, G.-Y. A1 Tseng, Y.-J. A1 Yang, Y.-J. A1 Hsieh, F.-C. A1 Chang, S.-H. A1 Liang, H. A1 Chiang, S.-H. A1 Liu, J.-H. A1 Lin, Y.-D. A1 Yeh, P.-C. A1 Wang, C.-Y. A1 Yang, H.-Y. A1 Tzeng, P.-J. A1 Liao, M.-H. A1 Chang, S. T. A1 Tseng, Y.-Y. A1 Lee, M. H. YR 2020 SN 1938-1891 K1 Ferroelectric K1 HfZrO2 K1 Omega SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129088 DO https://doi.org/10.1109/IRPS45951.2020.9129088 SF ELIB - SuUB Bremen
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