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Demonstration of Bilayer Gate Insulator for Improved Reliab..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Mukherjee, Kalparupa
;
De Santi, Carlo
;
Meneghesso, Gaudenzio
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129098
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-9129098&Exemplar=1&LAN=DE A1 Mukherjee, Kalparupa A1 De Santi, Carlo A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo A1 You, Shuzhen A1 Geens, Karen A1 Borga, Matteo A1 Bakeroot, Benoit A1 Decoutere, Stefaan YR 2020 SN 1938-1891 K1 GaN K1 vertical GaN K1 trench MOS K1 gate dielectric K1 breakdown K1 trapping K1 reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129098 DO https://doi.org/10.1109/IRPS45951.2020.9129098 SF ELIB - SuUB Bremen
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