I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Un..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Masin, F. ; Meneghini, M. ; Canato, E.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9129116