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1 Ergebnisse
1
Physical Insights into Phosphorene Transistor Degradation U..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Kumar, Jeevesh
;
Ansh
;
Yadav, Asha
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129123
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129123&Exemplar=1&LAN=DE A1 Kumar, Jeevesh A1 Ansh A1 Yadav, Asha A1 Singh, Anant A1 Naclerio, Andrew A1 Zakharov, Dmitri A1 Kidambi, Piran A1 Shrivastava, Mayank YR 2020 SN 1938-1891 K1 DFT K1 Phosphorene K1 Quantum K1 ATK K1 Raman SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129123 DO https://doi.org/10.1109/IRPS45951.2020.9129123 SF ELIB - SuUB Bremen
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