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1 Ergebnisse
1
The Mysterious Bipolar Bias Temperature Stress from the Per..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Grasser, T.
;
Kaczer, B.
;
O'Sullivan, B.
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129198
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129198&Exemplar=1&LAN=DE A1 Grasser, T. A1 Kaczer, B. A1 O'Sullivan, B. A1 Rzepa, G. A1 Stampfer, B. A1 Waltl, M. YR 2020 SN 1938-1891 SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129198 DO https://doi.org/10.1109/IRPS45951.2020.9129198 SF ELIB - SuUB Bremen
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