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Hot-Carrier induced Breakdown events from Off to On mode in..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Bravaix, Alain ; Kussener, Edith ; Ney, David.. - p. 1-8 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9129214