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1 Ergebnisse
1
Hot-Carrier induced Breakdown events from Off to On mode in..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Bravaix, Alain
;
Kussener, Edith
;
Ney, David
.. - p. 1-8 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129214
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS
UL https://suche.suub.uni-bremen.de/peid=ieee-9129214&Exemplar=1&LAN=DE A1 Bravaix, Alain A1 Kussener, Edith A1 Ney, David A1 Federspiel, Xavier A1 Cacho, Florian YR 2020 SN 1938-1891 K1 Index Terms -- Hot-Carrier K1 Breakdown K1 Off-mode K1 NEDMOS K1 Hot-Hole Injections SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129214 DO https://doi.org/10.1109/IRPS45951.2020.9129214 SF ELIB - SuUB Bremen
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