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1 Ergebnisse
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Reliability of 200mm E-mode GaN-on-Si Power HEMTs:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Zhou, David C.
;
Li, William
;
Shen, Jingyu
... - p. 1-3 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129220
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Reliability of 200mm E-mode GaN-on-Si Power HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-9129220&Exemplar=1&LAN=DE A1 Zhou, David C. A1 Li, William A1 Shen, Jingyu A1 Chen, Leilei A1 Zhao, Thomas A1 Lin, Kent A1 Zhang, Martin A1 Chen, Larry A1 Chiu, H. C. A1 Zhang, Jeff A1 Wong, Roy K.-Y. YR 2020 SN 1938-1891 K1 200mm K1 GaN-on-Si HEMT K1 E-mode K1 JEDEC Qualification K1 Dynamic Rds-on SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129220 DO https://doi.org/10.1109/IRPS45951.2020.9129220 SF ELIB - SuUB Bremen
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