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1 Ergebnisse
1
Exploring the DC reliability metrics for scaled GaN-on-Si d..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Putcha, V.
;
Bury, E.
;
Franco, J.
... - p. 1-8 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129251
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129251&Exemplar=1&LAN=DE A1 Putcha, V. A1 Bury, E. A1 Franco, J. A1 Walke, A. A1 Zhao, S.E. A1 Peralagu, U. A1 Zhao, M. A1 Alian, A. A1 Kaczer, B. A1 Waldron, N. A1 Linten, D. A1 Parvais, B. A1 Collaert, N. YR 2020 SN 1938-1891 K1 GaN K1 RF/5G applications K1 DC-reliability K1 buffer breakdown K1 buffer dispersion K1 device breakdown K1 device lifetime SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129251 DO https://doi.org/10.1109/IRPS45951.2020.9129251 SF ELIB - SuUB Bremen
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