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Thermal Characterization and TCAD Modeling of a Power Ampli..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Paliwoda, P. ; Rabie, M.A. ; Restrepo, O.D.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9129287