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1 Ergebnisse
1
Experimental Monitoring of Aging in CMOS RF Linear Power Am..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Rodriguez, Rosana
;
Crespo-Yepes, Albert
;
Martin-Martinez, Javier
... - p. 1-7 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129301
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation
UL https://suche.suub.uni-bremen.de/peid=ieee-9129301&Exemplar=1&LAN=DE A1 Rodriguez, Rosana A1 Crespo-Yepes, Albert A1 Martin-Martinez, Javier A1 Nafria, Montserrat A1 Aragones, Xavier A1 Mateo, Diego A1 Barajas, Enrique YR 2020 SN 1938-1891 K1 aging K1 reliability K1 RF K1 power amplifier K1 CMOS SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129301 DO https://doi.org/10.1109/IRPS45951.2020.9129301 SF ELIB - SuUB Bremen
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