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Modeling of Charge Failure Mechanisms during the Short Term..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Woo, Changbeom ; Kim, Shinkeun ; Park, Jaeyeol... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9129306