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1 Ergebnisse
1
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Uemura, Taiki
;
Chung, Byungjin
;
Jo, Jeongmin
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129331
RT T1
2020 IEEE International Reliability Physics Symposium (IRPS)
: T1
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM
UL https://suche.suub.uni-bremen.de/peid=ieee-9129331&Exemplar=1&LAN=DE A1 Uemura, Taiki A1 Chung, Byungjin A1 Jo, Jeongmin A1 Jiang, Hai A1 Ji, Yongsung A1 Jeong, Tae-Young A1 Ranjan, Rakesh A1 Lee, Seungbae A1 Rhee, Hwasung A1 Pae, Sangwoo A1 Lee, Euncheol A1 Choi, Jaehee A1 Ohnishi, Shota A1 Machida, Ken YR 2020 SN 1938-1891 K1 soft error K1 7 nm FinFET K1 SRAM K1 SER K1 SEU SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129331 DO https://doi.org/10.1109/IRPS45951.2020.9129331 SF ELIB - SuUB Bremen
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