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Fast & Accurate Methodology for Aging Incorporation in Circ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Mishra, S. ; Weckx, P. ; Lin, J. Y.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IRPS45951.2020.9129351