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1 Ergebnisse
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Relevance of fin dimensions and high-pressure anneals on ho..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Chasin, Adrian
;
Franco, Jacopo
;
Bury, Erik
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129584
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129584&Exemplar=1&LAN=DE A1 Chasin, Adrian A1 Franco, Jacopo A1 Bury, Erik A1 Ritzenthaler, Romain A1 Litta, Eugenio A1 Spessot, Alessio A1 Horiguchi, Naoto A1 Linten, Dimitri A1 Kaczer, Ben YR 2020 SN 1938-1891 K1 Hot-Carrier Degradation (HDC) K1 FinFET K1 SelfHeating Effects (SHE) K1 scaling SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129584 DO https://doi.org/10.1109/IRPS45951.2020.9129584 SF ELIB - SuUB Bremen
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