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1 Ergebnisse
1
STEM EBIC for High-Resolution Electronic Characterization:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Hubbard, W. A.
;
Lingley, Z.
;
Theiss, J.
.. - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129618
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>STEM EBIC for High-Resolution Electronic Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129618&Exemplar=1&LAN=DE A1 Hubbard, W. A. A1 Lingley, Z. A1 Theiss, J. A1 Brodie, M. A1 Foran, B. YR 2020 SN 1938-1891 K1 TEM K1 EBIC K1 EBAC K1 SEEBIC K1 FIB K1 barium titanate K1 ceramic capacitors SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129618 DO https://doi.org/10.1109/IRPS45951.2020.9129618 SF ELIB - SuUB Bremen
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